Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device.1

Table 1. Absolute maximum ratings
Note Min. Max. Unit
Supply voltages
VDD -0.3 +3.9 V
VDDH -0.3 +5.8 V
VBUS -0.3 +5.8 V
VSS 0 V
I/O pin voltage
VI/O, VDD ≤3.6 V -0.3 VDD + 0.3 V
VI/O, VDD >3.6 V -0.3 3.9 V
Environmental QFN40 package
Storage temperature -40 +125 °C
MSL Moisture Sensitivity Level 2
ESD HBM Human Body Model 3 kV
ESD HBM Class Human Body Model Class 2
ESD CDM Charged Device Model 1 kV
Environmental WLCSP 2.531 x 2.531 mm package
Storage temperature -40 +125 °C
MSL Moisture Sensitivity Level 1
ESD HBM Human Body Model 3 kV
ESD HBM Class Human Body Model Class 2
ESD CDM Charged Device Model 1 kV
Flash memory
Endurance 10 000 write/erase cycles
Retention at 85 °C 10 years
Retention at 105 °C Limited to 1000 write/erase cycles 3 years
Retention at 105 °C-85 °C, execution split

Limited to 1000 write/erase cycles

75% execution time at 85 °C or less

 6.7 years


1 For accelerated life time testing (HTOL, etc) supply voltage should not exceed the recommended operating conditions max value, see Recommended operating conditions.