Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device.
| Min. | Max. | Unit | |
|---|---|---|---|
| Supply voltages | |||
| VBAT | -0.3 | 4.5 | V |
| IOVDD | -0.3 | 3.6 | V |
| I/O pin voltage | |||
| VI/O, IOVDD ≤3.3 V | -0.3 | IOVDD + 0.3 | V |
| VI/O, IOVDD >3.3 V | -0.3 | 3.6 | V |
| BUCKEN | -0.3 | VBAT + 0.3 | V |
| Radio | |||
| RF input level | -10 | dBm | |
| Environmental QFN package | |||
| Storage temperature | -40 | 125 | °C |
| Moisture Sensitivity Level (MSL) | 2 | ||
| ESD Human Body Model (HBM) | 750 | V | |
| ESD Charged Device Model (CDM) | 1000 | V | |
| Environmental WLCSP package | |||
| Storage temperature | -40 | 125 | °C |
| Moisture Sensitivity Level (MSL) | 1 | ||
| ESD Human Body Model (HBM) | 750 | V | |
| ESD Charged Device Model (CDM) | 500 | V | |