Absolute maximum ratings

Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device.

For accelerated lifetime testing (HTOL, etc.), supply voltage should not exceed the recommended operating conditions max value, see Recommended operating conditions.

Table 1. Supply voltage

	Min.	Max.	Unit
VDD	-0.3	3.9	V
VDDH	-0.3	5.8	V
VBUS	-0.3	5.8	V
VSS	-0.3	0	V

Table 2. I/O pin voltage

	Min.	Max.	Unit
VI/O, VDD ≤ 3.6 V	-0.3	VDD + 0.3	V
VI/O, VDD > 3.6 V	-0.3	3.9	V

Table 3. NFC antenna pin current

	Min.	Max.	Unit
INFC1/2		80	mA

Table 4. Radio

	Min.	Max.	Unit
RF input level		10	dBm

Table 5. Environmental aQFN™ package

	Min.	Max.	Unit
Storage temperature	-40	+125	°C
Moisture Sensitivity Level (MSL)		2
ESD Human Body Model (HBM)		2 Pins DECR and DECN are 1.4	kV
ESD Charged Device Model (CDM)		500	V

Table 6. Environmental CLAA WLCSP package

	Min.	Max.	Unit
Storage temperature	-40	+125	°C
Moisture Sensitivity Level (MSL)		1
ESD Human Body Model (HBM)		2 Pins DECR and DECN are 1.4	kV
ESD Charged Device Model (CDM)		500	V

Table 7. Environmental CMAA WLCSP package

	Min.	Max.	Unit
Storage temperature	-40	+125	°C
Moisture Sensitivity Level (MSL)		1
ESD Human Body Model (HBM)		1.5	kV
ESD Charged Device Model (CDM)		500	V

Table 8. Flash memory

	Min.	Max.	Unit
Endurance	10,000 write/erase cycles
Retention	10 years at 85°C